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PROGRAM
| 7:30 - 8:15 |
Registration |
| 8:15 |
Opening |
| 8:30 - 9:00 |
Fundamentals of optical polarization microscopy (Irena Drevenšek Olenik) |
| 9:00 - 9:30 |
Quantitative microstructural analysis (Klementina Zupan) |
| 9:30 - 10:15 |
X-ray powder diffraction analysis (Anton Meden) |
| 10:15 - 10:30 |
Coffee break |
| 10:30 - 11:15 |
Analytical electron microscopy - a powerful tool for the development of new materials (Goran Dražić) |
| 11:15 - 11:45 |
Characterization of functional ceramics by scanning transmission electron microscopy combined with electron energy loss spectroscopy (Sašo Šturm) |
| 11:45 - 12:15 |
Scanning electron microscopy and microanalysis (Miran Čeh) |
| 12:15 - 13:15 |
Lunch |
| 13:15 - 13:45 |
Compositional and structural study of a (K0.5Na0.5)NbO3 single crystal using complementary microscopy techniques (Andreja Benčan) |
| 13:45 - 14:15 |
Structural characterization of polycrystalline thin films (Jesús Ricote) |
| 14:15 - 15:00 |
Piezoresponse force microscopy (PFM) as a tool to characterize piezoelectric materials (Tim Burnett) |
| 15:00 - 15:15 |
Coffee break |
| 15:30 - 17:30 |
Demonstration of SEM, TEM microscopes,
TEM sample preparation (Elena Tchernychova, Sebastjan Glinšek, Brigita Kužnik, Tina Ručigaj) |
LECTURERS
- Andreja Benčan, Jožef Stefan Institute
- Tim Burnett, National Physical Laboratory, UK
- Goran Dražić, Jožef Stefan Institute
- Irena Drevenšek Olenik, Jožef Stefan Institute
- Danjela Kuščer, Jožef Stefan Institute
- Anton Meden, Faculty of Chemistry and Chemical Technology, University of Ljubljana
- Jesús Ricote Santamaría, Materials Science Institute of Madrid, Spain
- Sašo Šturm, Jožef Stefan Institute
- Klementina Zupan, Faculty of Chemistry and Chemical Technology, University of Ljubljana
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